Course content

• Scan Insertion, need of scan insertion, scan DRCs, clearing Scan DRCs.
• Scan Compression, need of scan compression, EDT architecture, deciding no. of internal chains and external channels.
• Need of ATPG, fault simulation, fault classes, fault categories, fault models (SA, TDF, IDDQ, PDF), On-chip Clock Controller (OCC), different types of patterns, coverage analysis and improvement.
• Simulations, it’s need and simulation mismatch debug.
• JTAG, it’s need, TAP architecture, JTAG FSM, Boundary Scan.
• IJTAG architecture, advantage of IJTAG over JTAG
• Memory faults, algorithms, Tessent MBIST implementation and Architecture.
• Hierarchical Scan, Scan Wrappers.

Experienced Trainer

• 10+ years of rich experience of working on DFT Engineer